Characterization of texture in scanning electron microscope images

Advances in Imaging and Electron Physics

Volumn 120, Issue , 2003, Pages 135-191

  Ladaga, Juan Luis ^a   Bonetto, Rita Dominga ^b  

^a Group of Biomechanics   (Argentina)

^b UNIVERSIDAD NACIONAL DE LA PLATA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; FRACTALS; NOISE ABATEMENT; SCANNING ELECTRON MICROSCOPY; TEXTURES;

BONETTO AND LADAGA METHOD; FOURIER POWER SPECTRUM; VARIOGRAM;

IMAGE PROCESSING;

EID: 34247467457     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(02)80035-0     Document Type: Article

References (53)

1. Barabási A.L., and Stanley H.E. Fractal Concepts in Surface Growth (1995), Cambridge Univ. Press, Cambridge, UK
2. Barnsley M.F., Devaney R.L., Mandelbrot B.B., Peitgen H.-O., Saupe D., and Voss R.F. Fractals in nature: From characterization to simulation. In: Peitgen H.-O., and Saupe D. (Eds). The Science of Fractal Images (1988), Springer-Verlag, New York 21-70
3. min calculation. Scanning 23 (2001) 193-197
4. Bonetto, R. D. (1994). Private communication.
5. Bonetto, R. D., Forlerer, E., and Ladaga, J. L. (submitted). Characterization of the texture of digital images which have a periodicity or a quasi-periodicity. Meas. Sci. Technol.
6. Bonetto R.D., and Ladaga J.L. The variogram method for characterization of SEM images. Scanning 20 (1998) 457-463
7. Granada, Spain-1998. Bonetto R.D., Ozols A., Ladaga J.L., and Sancho E. Quantitative evaluation of solidification microstructures in centrifugally atomized powders. Proceedings of the PM'98 Powder Metallurgy World Congress. European Powder Metallurgy Association Editor Vol. 1 (1998) 202-207
8. Bonetto R.D., Sánchez M., Alvarez A.G., and Ladaga J.L. Descripción de la rugosidad de superficie a través de las imágenes del microscopio electrónico de barrido. In: SARX (Ed). Advances en Análisis por Técnicas de Rayos X Vol. 9 (1996), Facultad de Matemática, Astronomía y Física, Universidad Nacional de Córdoba, Córdoba Argentina 113-118 1515-1565
9. Briand L.E., Bonetto R.D., Ladaga J.L., and Donati E. Bulk and surface characterization of crystalline and plastic sulfur oxidized by two Thiobacillus species. Process Biochem. 34 3 (1999) 249-256
10. Brown R. On the existence of active molecules in organic and inorganic bodies. Philos. Mag. 4 (1828) 162-173
11. Bunde A., and Havlin S. Fractals in Science (1994), Springer-Verlag, Berlin/Heidelberg/New York
12. Bunde A., and Havlin S. Fractals and Disordered Systems (1996), Springer-Verlag, Berlin/Heidelberg/New York
13. Burrough P.A. Fractal dimensions of landscapes and other environmental data. Nature 294 (1981) 240-242
14. Einstein A. Über die von der molekularkinetischen Theorie der Wärme geforderte Bewegung von in ruhenden Flüssigkeiten suspendierten Teilchen. Ann. Phys. 322 (1905) 549-560
15. In: Family F., Meakin P., Sapoval B., and Wool R. (Eds). Fractal Aspects of Materials. Vol. 367, Materials Research Society Symposium Proceedings, Boston, MA (1994-1995), Materials Research Society, Pittsburgh, PA
16. Feder J. Fractals (1988), Plenum, New York/London
17. Goldstein J.I., Newbury D.E., Echlin P., Joy D.C., Romig Jr. A.D., Lyman C.E., Fiori C., and Lifshin E. Scanning Electron Microscopy and X-Ray Microanalysis. 2nd ed (1992), Plenum, New York/London
18. Hamblin M.G., and Stachowiak G.W. Comparison of boundary fractal dimensions from projected and sectioned particle images. Part I: Technique evaluation. J. Comput. Assist. Microsc. 5 4 (1993) 291-300
19. Hamblin M.G., and Stachowiak G.W. Measurement of fractal surface profiles obtained from scanning electron and laser scanning microscope images and contact profile meter. J. Comput. Assist. Microsc. 6 4 (1994) 181-194
20. Hausdorff F. Dimension und äussers Mass. Math. Ann. 79 (1919) 157-179
21. Holý V., and Baumbach T. Nonspecular x-ray reflection from rough multilayers. Phys. Rev. B 49 15 (1994) 10668-10676
22. Holý V., Kubena J., Ohlídal I., Lischka K., and Plotz W. X-ray reflection from rough layered systems. Phys. Rev. B 47 23 (1993) 15896-15903
23. Imai K. On the mechanism of bacterial leaching. In: Murr L.E., Torma A.E., and Brierley J.A. (Eds). Metallurgical Application of Bacterial Leaching and Related Microbiological Phenomena (1978), Academic Press, New York 275-294
24. Kanatani K. Fast Fourier transform. In: Beddow J.K. (Ed). Particle Characterization in Technology Vol. II (1984), CRC Press, Inc., Boca Raton, Florida 31-50
25. Kaye B. A Random Walk through Fractal Dimensions (1989), VCH, Weinheim/New York
26. Kaye B. Chaos and Complexity-Discovering the Surprising Patterns of Science and Technology (1993), VCH, Weinheim/New York
27. Mandelbrot B.B. How long is the coast of Britain? Statistical self-similarity and fractional dimension. Science 155 (1967) 636-638
28. Mandelbrot B.B., and Van Ness J.W. Fractional brownian motions, fractional noises and applications. Siam Rev. 10 (1968) 422-437
29. Mandelbrot B.B. The Fractal Geometry of Nature (1982), Freeman, New York
30. Mandelbrot B.B. Self-affine fractal dimension. Physica Scripta 32 (1985) 257-260
31. Mark D.M., and Aronson M.M. Scale-dependent fractal dimensions of topographic surfaces: an empirical investigation, with applications in geomorphology and computer mapping. Math. Geol. 16 7 (1984) 671-683
32. Nieminen A., Heinonen P., and Nuevo Y. A new class of detail-preserving filters for image processing. IEEE Trans. Patt. Anal. Mach. Intell. PAMI-9 (1987) 74-90
33. Nottale L. Fractal Space-Time and Microphysics-Towards a Theory of Scale Relativity (1993), World Scientific, Singapore
34. Oatley C.W., Nixon W.C., and Pease R.F.W. Advances in Electronic and Electron Physics (1965), Academic Press, New York
35. Palasantzas G., and De Hosson J.T.M. Roughness effect on the measurement of interfaces stress. Acta Mater. 48 (2000) 3641-3645
36. Pentland A.P. Fractal-based description of natural scenes. IEEE Trans. PAMI-6 6 (1984) 661-674
37. Podsiadlo P., and Stachowiak G.W. Median-sigma filter for SEM wear particle images. J. Comput. Assist. Microsc. 7 2 (1995) 67-82
38. Press W., Tolan M., Stettner J., Seeck O.H., Schlomka J.P., Nitz V., Schawalowsky L., Müller-Buschbaum P., and Bahr D. Roughness of surfaces and interfaces. Phys. B 221 (1996) 1-9
39. (Springer Series in Optical Sciences). Reimer L. Scanning Electron Microscopy-Physics and Image Formation and Microanalysis (1985), Springer-Verlag, Berlin/Heidelberg
40. Richardson L.F. The problem of contiguity: an appendix of statistics of deadly quarrels. Gen. Syst. Yearbook 6 (1961) 139-187
41. Russ J.C. Computer Assisted Microscopy: The Measurement and Analysis of Images (1990), Plenum, New York
42. Russ J.C. Fractal Surfaces (1994), Plenum, New York/London
43. Russ J.C., and Russ J.C. Feature-specific measurement of surface roughness in SEM images. Part. Charact. 4 (1987) 22-25
44. Sahimi M., Rassamdana H., and Mehrabi A. Fractals in porous media: from pore to field scale. In: Family F., Meakin P., Sapoval B., and Wool R. (Eds). Fractal Aspects of Materials. Vol. 367, Materials Research Society Symposium Proceedings, Boston, MA, 1994 (1995), Materials Research Society, Pittsburgh, PA 200-214
45. Schippers A., Jozsa P., and Sand W. Sulphur chemistry in bacterial leaching of pyrite. Appl. Environ. Microbiol. 62 (1996) 3424-3431
46. Sinha S.K., Sirota E.B., Garoff S., and Stanley H.B. X-ray and neutron scattering from rough surfaces. Phys. Rev. B 38 4 (1988) 2297-2311
47. ISNN 0909-3192. Skands U. Quantitative methods for the analysis of electron microscope images. Doctoral thesis (1996), Technical University of Denmark, Institute of Mathematical Modelling (IMM) 73-77
48. 2 layers on Si(111): partially correlated roughness and diffuse x-ray scattering. Phys. Rev. B 53 3 (1996) 1398-1412
49. Tukey J.W. Exploratory Data Analysis (1971), Addison-Wesley, Reading, MA
50. Van Put A. Geochemical and morphological characterization of individual particles from the aqueous environment by EPXMA. Doctoral thesis (1991), Universiteit Antwerpen, Universitaire Instelling Antwerpen, Departement Scheikunde, Belgium
51. Viturro H., Peez C., and Bonetto R.D. Desarrollo e implementación de un sistema digital de adquisición, procesamiento y análisis de imágenes y espectros de rayos x. In: Inés D.M. (Ed). Avances en Análisis por Técnicas en Rayos X Vol. 8 (1994), Universidad de Chile, Santiago, Chile 379-384
52. Wiener N. Differential-space. J. Math. Phys. Mass. Inst. Technol. 2 (1923) 131-174
53. Zhao Y.P., Yang H.N., Wang G.C., and Lu T.M. Diffraction from diffusion-barrier-induced mound structures in epitaxial growth fronts. Phys. Rev. B 57 3 (1998) 1922-1934