Reliability and failure mode investigation of high power multi-mode InGaAs strained quantum well single emitters

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6456, Issue , 2007, Pages

  Sin, Yongkun ^a   Foran, Brendan ^a   Presser, Nathan ^a   Mason, Maribeth ^a   Moss, Steven C ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

Broad area lasers; Failure modes; High power lasers; Reliability; Strained quantum well lasers

Indexed keywords

FAILURE MODE ANALYSIS; LASER STRUCTURE DESIGN; OPTICAL OUTPUT POWER; POWER CONVERSION EFFICIENCY;

CONTINUOUS WAVE LASERS; CONVERSION EFFICIENCY; FAILURE MODES; HIGH POWER LASERS; OPTIMIZATION; QUANTUM WELL LASERS; RELIABILITY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE;

SEMICONDUCTOR QUANTUM WELLS;

EID: 34247370580     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.697194     Document Type: Conference Paper

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