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Volumn 6415, Issue , 2007, Pages

Surface morphology and stress analysis of piezoelectric strontium-doped lead zirconate titanate thin films

Author keywords

PSZT; RF magnetron sputtering; Stoney's equation; Stress; Surface morphology

Indexed keywords

DOPING (ADDITIVES); FERROELECTRICITY; LEAD COMPOUNDS; PEROVSKITE; PIEZOELECTRIC CERAMICS; PYROELECTRICITY; STRESS ANALYSIS; STRONTIUM; SURFACE MORPHOLOGY;

EID: 34247359119     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.695941     Document Type: Conference Paper
Times cited : (1)

References (6)
  • 1
    • 0035248786 scopus 로고    scopus 로고
    • Phase Stability and Ferroelectric Properties of Lead Strontium Zirconate Titanate Ceramics
    • Y. Yu, J. Tu, and R. N. Singh, "Phase Stability and Ferroelectric Properties of Lead Strontium Zirconate Titanate Ceramics," Journal of American Ceramic Society, vol. 84, no. 2, pp. 333-340, 2001.
    • (2001) Journal of American Ceramic Society , vol.84 , Issue.2 , pp. 333-340
    • Yu, Y.1    Tu, J.2    Singh, R.N.3
  • 4
    • 32944479390 scopus 로고    scopus 로고
    • RF magnetron sputtered perovskite-oriented PSZT thin-films on gold for piezoelectric and ferroelectric transducers
    • M. Bhaskaran, S. Sriram, and A. S. Holland, "RF magnetron sputtered perovskite-oriented PSZT thin-films on gold for piezoelectric and ferroelectric transducers," Electronic Letters, vol. 20, no. 4, 2006.
    • (2006) Electronic Letters , vol.20 , Issue.4
    • Bhaskaran, M.1    Sriram, S.2    Holland, A.S.3
  • 6
    • 34247402152 scopus 로고    scopus 로고
    • XP Series Stylus Profiler User's Manual, Ambios Technology, Inc., p. 79, 2003.
    • XP Series Stylus Profiler User's Manual, Ambios Technology, Inc., p. 79, 2003.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.