In situ investigation of the selenization kinetics of Cu-Ga precursors using time-resolved high-temperature X-ray diffraction

Thin Solid Films

Volumn 515, Issue 15 SPEC. ISS., 2007, Pages 5837-5842

  Kim, W K ^a   Payzant, E A ^b   Anderson, T J ^a   Crisalle, O D ^a  

^a University of Florida   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Avrami model; CuGaSe2; Selenization; X ray diffraction

Indexed keywords

ACTIVATION ENERGY; DIFFUSION; HIGH TEMPERATURE OPERATIONS; METALLIC FILMS; REACTION KINETICS; X RAY DIFFRACTION ANALYSIS;

AVRAMI MODELS; SELENIZATION;

COPPER ALLOYS;

EID: 34247353639     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.173     Document Type: Article

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