In-situ observation of CuInSe2 formation process using high-temperature X-ray diffraction analysis

Thin Solid Films

Volumn 347, Issue 1-2, 1999, Pages 151-154

  Katsui, Akinori ^a   Iwata, Tsunekazu ^b  

^a Sch High Technol Hum Welf   (Japan)

^b NTT Access Network Service Systems Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; INDIUM COMPOUNDS; REACTION KINETICS; SELENIUM; SEMICONDUCTOR MATERIALS; SOLAR CELLS; TEMPERATURE; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

HIGH TEMPERATURE X RAY DIFFRACTION ANALYSIS; IN SITU OBSERVATION; MELTING POINT; STACKED ELEMENTAL LAYERS;

THIN FILMS;

EID: 0345201746     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01747-7     Document Type: Article

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