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Volumn 18, Issue 2, 2007, Pages 360-366

Facility and methods for the measurement of micro and nano forces in the range below 10-5 N with a resolution of 10-12 N (development concept)

Author keywords

Difference measurement; Disc pendulum; Electrostatic stiffness reduction; Electrostatic system; Micro force; Nano force; Seismic noise; Thermal noise; Traceability of the smallest forces

Indexed keywords

DEFLECTION (STRUCTURES); ELECTROSTATICS; SPURIOUS SIGNAL NOISE; STIFFNESS; THERMAL NOISE;

EID: 34247214021     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/2/S06     Document Type: Conference Paper
Times cited : (70)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.