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Volumn 16, Issue 7, 2006, Pages 1116-1127

Modelling and investigation of the mechanical and electrical characteristics of the silicon 3D-boss microprobe for force and deflection measurements

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; DEFORMATION; OPTIMIZATION; RESISTORS; SENSITIVITY ANALYSIS; SENSORS; SILICON; STIFFNESS; STRETCHING; TRANSDUCERS;

EID: 33745058702     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/16/7/003     Document Type: Article
Times cited : (23)

References (28)
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    • Büttgenbach, S.1    Bütefisch, S.2    Schmidt, M.3    Brand, U.4    Cao, S.5    Pornnoppadol, P.6
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    • Bütefisch S 2003 New micro probe for dimensional metrology based on a silicon microstructure Proc. Sensor 2003 pp 75-80
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    • Metrological characterization of a new three-axis piezoresistive micro probe
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    • Nesterov V and Brand U 2005 Modelling and investigation of the silicon twin design 3D micro probe J. Micromech. Microeng. 15 514-20
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.