The imaginary part: A source of creativity in instrumentation and measurement

IEEE Instrumentation and Measurement Magazine

Volumn 10, Issue 1, 2007, Pages 29-33

  Xu, Fang ^a  

^a Teradyne's Semiconductor Test Division   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; DISCRETE FOURIER TRANSFORMS; PHASE MODULATION; THREE DIMENSIONAL; TWO DIMENSIONAL; WAVEFORM ANALYSIS;

CAPTURED WAVEFORM; SIGNAL ANALYSIS METHOD; SINE WAVES;

SIGNAL ANALYSIS;

EID: 34147166648     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2007.339541     Document Type: Article

References (4)

1. F.J. Harris, "On the use of windows for harmonic analysis with the discrete Fourier transform," Proc. IEEE, vol. 66, pp. 51-83, Jan 1978.
2. F. Xu " Algorithm to removed spectral leakage, close-in noise, and its application to converter test," in Proc. IEEE Instrumentation Measurement Technology Conf., Sorrento, Italy, Apr. 2006, pp 1038-1042.
3. I. Kollar and J. Blair, "Improved determination of the best fitting sine wave in ADC testing," IEEE Trans. Instrum. Meas. vol. 54, no. 5, pp. 1978-1983, 2005.
4. T.Z. Bilau, T. Megyeri, A. Sarhegyi, J. Markus, and I. Kollar, "Four parameter fitting of sine wave testing result: Iteration and convergence," Comput. Standards Interfaces, vol. 26, pp. 51-56, 2004