Algorithm to remove spectral leakage, close-in noise, and its application to converter test

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2006, Pages 1038-1042

  Xu, Fang ^a  

^a TERADYNE INC   (United States)

Author keywords

ADC; Close in phase noise; Crystal oscillator; DAC; Fourier transform; Jitter; Non coherent sampling; Power estimation; Production test; Spectral leakage; Window function

Indexed keywords

CRYSTAL OSCILLATORS; ELECTRIC CONVERTERS; JITTER; POWER CONTROL; SIGNAL DISTORTION; SPURIOUS SIGNAL NOISE;

POWER ESTIMATION; PRODUCTION TESTS; SPECTRAL LEAKAGE; WINDOW FUNCTIONS;

DISCRETE FOURIER TRANSFORMS;

EID: 34147101210     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2006.237116     Document Type: Conference Paper

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