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Volumn 14, Issue 2, 2007, Pages 393-399

Dependence of XLPE insulated power cable wave propagation characteristics on design parameters

Author keywords

Attenuation; Dielectric; High frequency; Insulation; Phase velocity; Propagation characteristics; Semi conducting screens; Series impedance; Shunt admittance

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC INSULATION; ELECTRIC POTENTIAL; PARAMETER ESTIMATION; PHASE VELOCITY;

EID: 34147119069     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2007.344619     Document Type: Article
Times cited : (53)

References (11)
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  • 3
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    • Boggs, S.1    Pathak, A.2    Walker, P.3
  • 4
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    • Semiconducting layer impedance and its effect on cable wave propagation and transient characteristics
    • A. Ametani, Y. Miyamoto and N. Nagaoka, "Semiconducting layer impedance and its effect on cable wave propagation and transient characteristics", IEEE Trans. Power Delivery, Vol. 19, pp. 1523-1531, 2004.
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    • Ametani, A.1    Miyamoto, Y.2    Nagaoka, N.3
  • 5
    • 29244462862 scopus 로고    scopus 로고
    • High frequency properties of shielded power cable - part 1 : Overview of mechanisms
    • C. Xu, L. Zhou, J.Y. Zhou and S. Boggs, "High frequency properties of shielded power cable - part 1 : overview of mechanisms", IEEE Electr. Insul. Mag., Vol. 21, No. 6, pp. 24-28, 2005.
    • (2005) IEEE Electr. Insul. Mag , vol.21 , Issue.6 , pp. 24-28
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  • 6
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    • High frequency properties of shielded power cable. Part 2: Sources of error in measuring shield dielectric properties
    • C. Xu and S. Boggs, "High frequency properties of shielded power cable. Part 2: sources of error in measuring shield dielectric properties", IEEE Electr. Insul. Mag. Vol. 22, No. 1, pp. 7-13, 2006.
    • (2006) IEEE Electr. Insul. Mag , vol.22 , Issue.1 , pp. 7-13
    • Xu, C.1    Boggs, S.2
  • 7
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    • Measurement technique for high frequency characterization of semi-conducting materials in extruded cables
    • O. Mugala, R. Eriksson, U. Gäfvert and P. Petterson, "Measurement technique for high frequency characterization of semi-conducting materials in extruded cables", IEEE Trans. Dielectr. Electr. Insul, Vol. 11, pp. 471-480, 2004.
    • (2004) IEEE Trans. Dielectr. Electr. Insul , vol.11 , pp. 471-480
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.