Measurement technique for high frequency characterization of semi-conducting materials in extruded cables

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 11, Issue 3, 2004, Pages 471-480

  Mugala, Gavita ^a   Eriksson, Roland ^a   Gäfvert, Uno ^b   Pettersson, Per ^c  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b ABB CORPORATE RESEARCH   (Sweden)

^c RINGHALS AB   (Sweden)

Author keywords

Admittance; Attenuation; Cables; Complex permittivity; Cross linked polyethylene; Dielectric function; Geometric capacitance; High frequency cable model; Propagation constant; Scattering parameters; Semi conducting screen; Semicon; XLPE

Indexed keywords

DIELECTRIC FUNCTION; HIGH FREQUENCY CABLE MODEL; PROPAGATION CONSTANT; SEMICON; SEMIN-CONDUCTING SCREEN;

ATTENUATION; CABLES; CAPACITANCE; ELECTRIC ADMITTANCE; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; PARAMETER ESTIMATION; PERMITTIVITY; POLYETHYLENES; WAVE PROPAGATION;

SEMICONDUCTOR MATERIALS;

EID: 3142685105     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2004.1306725     Document Type: Article

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