High frequency properties of shielded power cable part 2: Sources of error in measuring shield dielectric properties

IEEE Electrical Insulation Magazine

Volumn 22, Issue 1, 2006, Pages 7-13

  Xu, Chunchuan ^a   Boggs, S A ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

Conductivity; Electrode surface resistance; High frequency propagation; Relative dielectric constant; Semiconducting shield properties

Indexed keywords

ELECTRODE SURFACE RESISTANCE; HIGH FREQUENCY PROPAGATION; RELATIVE DIELECTRIC CONSTANT; SEMICONDUCTING SHIELD PROPERTIES;

CAPACITANCE; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRODES; PERMITTIVITY;

ELECTRIC CABLES;

EID: 33947207597     PISSN: 08837554     EISSN: None     Source Type: Journal    
DOI: 10.1109/MEI.2006.1618966     Document Type: Article

References (8)

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