Phase noise compensation in ADC characterization by spectral analysis

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2005, Pages 1537-1540

  Haddadi, Dj ^a   Dallet, D ^b   Marchegay, Ph ^b  

^a STMICROELECTRONICS   (France)

^b UNIVERSITÉ BORDEAUX 1   (France)

Author keywords

ADC testing; Median filter; Phase noise; Spectral analysis

Indexed keywords

ANALOG TO DIGITAL CONVERSION; COMPUTER HARDWARE; DATA REDUCTION; SIGNAL FILTERING AND PREDICTION; SPECTRUM ANALYSIS;

DUAL-TONE MODES; MEDIAN FILTERING; PHASE NOISE COMPENSATION; SPECTRAL SUBTRACTION;

SIGNAL NOISE MEASUREMENT;

EID: 33847161569     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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