Amplifier noise-parameter measurement checks and verification

63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization

Volumn , Issue , 2004, Pages 41-45

  Randa, J ^a   Walker, D K ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Amplifier; Noise; Noise measurement; Noise parameters

Indexed keywords

INPUT PORTS; ISOLATORS; NOISE MEASUREMENT; NOISE PARAMETERS;

COMPUTATIONAL METHODS; ELECTRIC LOADS; ERRORS; MONTE CARLO METHODS; PARAMETER ESTIMATION; SPURIOUS SIGNAL NOISE; STANDARDS;

AMPLIFIERS (ELECTRONIC);

EID: 18844382351     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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