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Volumn 54, Issue 3-4, 2007, Pages 473-485

Dihedral representations and statistical geometric optics II: Elementary optical instruments

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER ANALYSIS; LINEAR SYSTEMS; MATRIX ALGEBRA; RADIATION EFFECTS; STATISTICAL METHODS; TWO DIMENSIONAL;

EID: 34047206753     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340600715185     Document Type: Article
Times cited : (8)

References (26)
  • 14
    • 28044432674 scopus 로고    scopus 로고
    • IMPA Institute for Pure and Applied Mathematics, Rio de Janeiro, Brazil
    • M. Viana, Symmetry Studies - An Introduction (IMPA Institute for Pure and Applied Mathematics, Rio de Janeiro, Brazil, 2003).
    • (2003) Symmetry Studies - An Introduction
    • Viana, M.1
  • 15
    • 34047223206 scopus 로고    scopus 로고
    • M. Viana, Lecture Notes on Symmetry Studies (EURANDOM, Eindhoven University of Technology, Eindhoven, The Netherlands, 2005), report number 2005-027. Available online at http://www.eurandom.tue.nl
    • M. Viana, Lecture Notes on Symmetry Studies (EURANDOM, Eindhoven University of Technology, Eindhoven, The Netherlands, 2005), report number 2005-027. Available online at http://www.eurandom.tue.nl
  • 19
    • 34047223077 scopus 로고    scopus 로고
    • M. Viana, Method. Comput. Appl. Probab. 5 439 (2003).
    • M. Viana, Method. Comput. Appl. Probab. 5 439 (2003).
  • 20
  • 21
    • 34047208837 scopus 로고    scopus 로고
    • M. Viana, Method. Comput. Appl. Probab. (2006) (in press).
    • M. Viana, Method. Comput. Appl. Probab. (2006) (in press).
  • 26
    • 0035618213 scopus 로고    scopus 로고
    • P. Cartier, Bull. (New Ser.) Am. Math. Soc. 38 389 (2001).
    • P. Cartier, Bull. (New Ser.) Am. Math. Soc. 38 389 (2001).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.