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Volumn 101, Issue 6, 2007, Pages

Analytical expressions for the conductance noise measured with four circular contacts placed in a square array

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC CONTACTS; ELECTRIC RESISTANCE MEASUREMENT; ELECTROCHEMICAL ELECTRODES;

EID: 34047146445     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2434942     Document Type: Article
Times cited : (9)

References (16)
  • 3
    • 34047136697 scopus 로고    scopus 로고
    • Eindhoven University of Technology, TH Report No. 79-E-94
    • unpublished, pp
    • A. H. de Kuijper and L. K. J. Vandamme, Eindhoven University of Technology, TH Report No. 79-E-94 (unpublished), pp. 1-60.
    • de Kuijper, A.H.1    Vandamme, L.K.J.2
  • 11
    • 0041322843 scopus 로고    scopus 로고
    • edited by M. J. Deen, Z. CelikButler, and M. E. Levinshtein SPIE, Bellingham, WA
    • J. Przybytek, V. Mosser, and Y. Haddab, in Noise in Devices and Circuits, edited by M. J. Deen, Z. CelikButler, and M. E. Levinshtein (SPIE, Bellingham, WA, 2003), p. 475.
    • (2003) Noise in Devices and Circuits , pp. 475
    • Przybytek, J.1    Mosser, V.2    Haddab, Y.3
  • 12
    • 34047179055 scopus 로고    scopus 로고
    • Y. Haddab, V. Mosser, A. Lysowec, J. Suski, L. Demeus, C. Renaux, S. Adriaensen, and D. Flandre, in Noise and Information in Nanoelectronics, Sensors and Standards, edited by L. B. Kish, F. Green, G. lannaccone, and J. R. Vig (SPIE, Bellingham, WA, 2003), p. 196.
    • Y. Haddab, V. Mosser, A. Lysowec, J. Suski, L. Demeus, C. Renaux, S. Adriaensen, and D. Flandre, in Noise and Information in Nanoelectronics, Sensors and Standards, edited by L. B. Kish, F. Green, G. lannaccone, and J. R. Vig (SPIE, Bellingham, WA, 2003), p. 196.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.