Finite element analysis of resistivity measurement with four point probe in a diamond anvil cell

Journal of Applied Physics

Volumn 101, Issue 6, 2007, Pages

  Huang, Xiaowei ^a   Gao, Chunxiao ^a   Li, Ming ^a   He, Chunyuan ^a   Hao, Aimin ^a   Zhang, Dongmei ^a   Yu, Cuiling ^a   Wang, Yue ^a   Sang, Chong ^a   Cui, Xiaoyan ^a   Zou, Guangtian ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIAMONDS; ELECTRIC CONDUCTIVITY MEASUREMENT; ERROR ANALYSIS; FINITE ELEMENT METHOD; PROBES; SEMICONDUCTOR MATERIALS;

CURRENT FIELD DISTRIBUTION; DIAMOND ANVIL CELLS (DAC); FOUR POINT PROBE METHOD;

ELECTRIC BATTERIES;

EID: 34047136031     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2712173     Document Type: Article

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