Characterization of thermally stable W/Ni multilayers by X-rays and cross-sectional transmission electron microscopy

Thin Solid Films

Volumn 515, Issue 13, 2007, Pages 5227-5232

  Bagchi, Sharmistha ^a   Lalla, N P ^a  

^a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

Cross sectional transmission electron microscopy; Superlattice multilayer structure; X ray diffraction; X ray reflectivity

Indexed keywords

ELECTRON DIFFRACTION; MULTILAYERS; THERMODYNAMIC STABILITY; X RAY DIFFRACTION; X RAYS;

CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; MULTILAYER STRUCTURES (MLS); SUPERLATTICE MULTILAYER STRUCTURES; X-RAY REFLECTIVITY;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 33947720856     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.177     Document Type: Article

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