Correlation of structural, chemical, and magnetic properties in annealed Ti/Ni multilayers

Journal of Applied Physics

Volumn 97, Issue 4, 2005, Pages

  Bhatt, Pramod ^a   Sharma, Anupam ^a   Chaudhari, S M ^a  

^a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM EVAPORATION; GRAZING INCIDENCE X-RAY DIFFRACTION (GIXRD); GRAZING INCIDENCE X-RAY REFLECTOMETRY (GIXRR); STRUCTURAL MODIFICATION;

ANNEALING; CARRIER CONCENTRATION; COERCIVE FORCE; ELECTRON BEAMS; EVAPORATION; KERR MAGNETOOPTICAL EFFECT; MAGNETIZATION; MICROSTRUCTURE; NICKEL; PRECIPITATION (CHEMICAL); SURFACE ROUGHNESS; SYNTHESIS (CHEMICAL); TITANIUM; ULTRAHIGH VACUUM; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

MULTILAYERS;

EID: 13844298101     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1835561     Document Type: Article

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