EXAFS study of the amorphous phase of InP after swift heavy ion irradiation

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 257, Issue 1-2 SPEC. ISS., 2007, Pages 293-296

  Schnohr, C S ^a   Kluth, P ^a   Byrne, A P ^a   Foran, G J ^b   Ridgway, M C ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

Amorphous structure; Extended X ray absorption fine structure spectrometry; InP; Swift heavy ion irradiation

Indexed keywords

AMORPHOUS SEMICONDUCTORS; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; ION BOMBARDMENT; ION IMPLANTATION; METAL IONS; PARAMETER ESTIMATION;

HOMOPOLAR BONDS; STRUCTURAL PARAMETERS; SWIFT HEAVY ION IRRADIATION;

INDIUM COMPOUNDS;

EID: 33947685305     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.01.019     Document Type: Article

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