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Volumn 58, Issue 5, 2007, Pages 471-478

Oxidation behavior of sputter-deposited Ti-Ni thin films at elevated temperatures

Author keywords

Oxidation kinetics; Structure; Surface roughness; TiNi thin films

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; OXIDATION; REACTION KINETICS; SPUTTER DEPOSITION; SURFACE ROUGHNESS; THERMAL EFFECTS; X RAY DIFFRACTION;

EID: 33947663509     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2006.06.011     Document Type: Article
Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.