Investigations of nano size defects in InP induced by swift iron ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 257, Issue 1-2 SPEC. ISS., 2007, Pages 287-292

  Dubey, R L ^a   Dubey, S K ^a   Yadav, A D ^a   Gupta, S J ^a   Pandey, S D ^a   Gundu Rao, T K ^b   Mohanty, T ^c   Kanjilal, D ^d  

^a UNIVERSITY OF MUMBAI   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^c JAWAHARLAL NEHRU UNIVERSITY   (India)

^d INTER UNIVERSITY ACCELERATOR CENTRE   (India)

Author keywords

AFM; Fe ions; High resolution X ray diffraction; InP; Swift heavy ion irradiation

Indexed keywords

ATOMIC FORCE MICROSCOPY; ION BOMBARDMENT; LATTICE MISMATCH; METAL IONS; NANOTECHNOLOGY; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

DEFECT CLUSTERS; NANO SIZE DEFECTS; SCREW DISLOCATIONS; SWIFT IRON IONS;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 33947645261     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.01.093     Document Type: Article

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