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Volumn 90, Issue 12, 2007, Pages

Effect of ionization rates on dynamic recovery processes during electron-beam irradiation of 6H-SiC

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; ELECTRON BEAMS; IONIZATION; SURFACE DEFECTS; THERMAL EFFECTS;

EID: 33947579769     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2715135     Document Type: Article
Times cited : (12)

References (19)
  • 5
    • 33947599685 scopus 로고    scopus 로고
    • ORNL/CP-96799 (National Technical Information Service, Springfield, VA, 1998).
    • J. Bentley, Report No. ORNL/CP-96799 (National Technical Information Service, Springfield, VA, 1998).
    • Bentley, J.1
  • 14
    • 33644586728 scopus 로고
    • Proceedings of the Sixth International Congress for Electron Microscopy, Kyoto, Japan, edited by R.Uyeda (Maruzen, Tokyo), Vol.
    • K. Kobayashi and M. Ohara, Proceedings of the Sixth International Congress for Electron Microscopy, Kyoto, Japan, 1966, edited by, R. Uyeda, (Maruzen, Tokyo), Vol. 1, p. 579.
    • (1966) , vol.1 , pp. 579
    • Kobayashi, K.1    Ohara, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.