Rapid, automated measurement of layer thicknesses on steel coin blanks using laser-induced-breakdown spectroscopy depth profiling

Applied Optics

Volumn 46, Issue 6, 2007, Pages 935-942

  Asimellis, George ^a   Giannoudakos, Aggelos ^b,c   Kompitsas, Michael ^c  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

^c THEORETICAL AND PHYSICAL CHEMISTRY INSTITUTE   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROPLATED PRODUCTS; INDUCTIVELY COUPLED PLASMA; LASER ABLATION; LASER SPECTROSCOPY; REAL TIME SYSTEMS; STEEL STRUCTURES;

CURRENT SPECTROSCOPIC METHOD; LAYER THICKNESS; NEAR REAL TIME METHOD; PRECALIBRATED COINS;

THICKNESS MEASUREMENT;

EID: 33947523703     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.000935     Document Type: Article

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