Bayesian NDE defect signal analysis

IEEE Transactions on Signal Processing

Volumn 55, Issue 1, 2007, Pages 372-378

  Dogandžić, Aleksandar ^a   Zhang, Benhong ^a  

^a Iowa State University   (United States)

Author keywords

Bayesian analysis; Defect estimation and detection; Markov chain Monte Carlo (MCMC) methods; Nondestructive evaluation (NDE)

Indexed keywords

COMPUTER SIMULATION; DEFECTS; INSPECTION; MARKOV PROCESSES; MONTE CARLO METHODS; NONDESTRUCTIVE EXAMINATION;

BAYESIAN ANALYSIS; MARKOV CHAIN MONTE CARLO METHODS; POSTERIOR DISTRIBUTION;

SIGNAL ANALYSIS;

EID: 33947417247     PISSN: 1053587X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSP.2006.882064     Document Type: Article

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