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Volumn 5, Issue 12, 2005, Pages 519-528
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Surface morphology and sensing property of NiO-WO3 thin films prepared by thermal evaporation
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Author keywords
Surface morphology; Thermal evaporation; Thin films; Tungston oxide
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Indexed keywords
ALUMINA;
DEPOSITION;
EVAPORATION;
FILM GROWTH;
MORPHOLOGY;
OXIDE FILMS;
SCANNING ELECTRON MICROSCOPY;
SURFACE MORPHOLOGY;
THERMAL EVAPORATION;
THIN FILMS;
VACUUM EVAPORATION;
X RAY DIFFRACTION;
CRYSTALLANITY;
DEPOSITION SEQUENCES;
HIGH VACUUM;
OPTIMUM DEPOSITION;
POLYCRYSTALLINE GRAINS;
SENSING CHARACTERISTICS;
SENSING PROPERTY;
GRAIN GROWTH;
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EID: 33947378585
PISSN: 14243210
EISSN: 14248220
Source Type: Journal
DOI: 10.3390/s5120519 Document Type: Article |
Times cited : (17)
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References (10)
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