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Volumn 5, Issue 12, 2005, Pages 519-528

Surface morphology and sensing property of NiO-WO3 thin films prepared by thermal evaporation

Author keywords

Surface morphology; Thermal evaporation; Thin films; Tungston oxide

Indexed keywords

ALUMINA; DEPOSITION; EVAPORATION; FILM GROWTH; MORPHOLOGY; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; SURFACE MORPHOLOGY; THERMAL EVAPORATION; THIN FILMS; VACUUM EVAPORATION; X RAY DIFFRACTION;

EID: 33947378585     PISSN: 14243210     EISSN: 14248220     Source Type: Journal    
DOI: 10.3390/s5120519     Document Type: Article
Times cited : (17)

References (10)
  • 4
    • 0029250551 scopus 로고    scopus 로고
    • 3 gas sensing films. Thin Solid Films 1995, 256, 247-252.
    • 3 gas sensing films. Thin Solid Films 1995, 256, 247-252.
  • 6
    • 0032122155 scopus 로고    scopus 로고
    • Physical and structural characterization of tungsten oxide thin films for NO gas detection
    • Manno, D.; Serra, A.; Di Giulio, M.; Micocci, G.; Tepore, A. Physical and structural characterization of tungsten oxide thin films for NO gas detection, Thin Solid Films, 1998, 324, 44-51.
    • (1998) Thin Solid Films , vol.324 , pp. 44-51
    • Manno, D.1    Serra, A.2    Di Giulio, M.3    Micocci, G.4    Tepore, A.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.