Progress toward submicron hard x-ray imaging using elliptically bent mirrors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3152, Issue , 1997, Pages 126-133

  MacDowell, Alastair A ^a   Celestre, Richard S ^a   Chang, Chang Hasnain C ^a   Franck, Keith D ^a   Howells, Malcolm R ^a   Locklin, Scott C ^a   Padmore, Howard A ^a   Patel, J R ^a   Sandler, Reuben ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Adaptive optics; Bent mirrors; Micro focusing; X ray; X ray diffraction

Indexed keywords

DIFFRACTION; ELECTROMAGNETIC WAVES; LIGHT; MIRRORS; SPECTROSCOPIC ANALYSIS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY ANALYSIS; X RAY DIFFRACTION;

ADAPTIVE OPTICS; BENT MIRRORS; ENERGY RANGES; ERROR MEASUREMENTS; KNIFE EDGE; MICRO-FOCUSING; MIRROR SUBSTRATE (MS); X-RAY;

X RAYS;

EID: 0005860934     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.279374     Document Type: Conference Paper

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