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Volumn 158, Issue 1, 2007, Pages 10-18
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Classification of continuous diffraction patterns: A numerical study
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Author keywords
Image classification; Orientation; Single particle X ray diffraction; Structure reconstruction; X ray free electron lasers
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Indexed keywords
ANALYTIC METHOD;
ARTICLE;
ATOMIC PARTICLE;
CALCULATION;
EXPERIMENTATION;
MATHEMATICAL MODEL;
PARTICLE SIZE;
PRIORITY JOURNAL;
QUANTITATIVE STUDY;
SIMULATION;
X RAY DIFFRACTION;
IMAGING, THREE-DIMENSIONAL;
LASERS;
MICROSCOPY, ELECTRON;
MODELS, CHEMICAL;
PARTICLE SIZE;
SCATTERING, RADIATION;
X-RAY DIFFRACTION;
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EID: 33947301779
PISSN: 10478477
EISSN: 10958657
Source Type: Journal
DOI: 10.1016/j.jsb.2006.10.018 Document Type: Article |
Times cited : (30)
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References (14)
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