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Volumn 225, Issue 3, 2007, Pages 236-243

In situ atomic force microscopy and image analysis of dentine submitted to acid etching

Author keywords

Acid etching; AFM; Dentine; Image analysis; In situ microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETCHING; SURFACE CLEANING;

EID: 33947255174     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2007.01738.x     Document Type: Article
Times cited : (4)

References (14)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.