메뉴 건너뛰기
Applied Optics
Volumn 46, Issue 4, 2007, Pages 502-505
Closed equation for the normal incidence reflectance of thin films on absorbing substrates
Author keywords

[No Author keywords available]
Indexed keywords

COMPUTATIONAL METHODS; GRADIENT METHODS; LIGHT REFLECTION; OPTIMIZATION; SPECTROPHOTOMETRY; SUBSTRATES;
EID: 33947122231     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.000502     Document Type: Article
Times cited : (6)
References (8)
  • 1
    • 13744259356 scopus 로고    scopus 로고
    • Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data
    • S. D. Ventura, E. G. Birgin, J. M. Martinez, and I. Chambouleyron, "Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data," J. Appl. Phys. 97, 1-12 (2005).
    • (2005) J. Appl. Phys , vol.97 , pp. 1-12
    • Ventura, S.D.1    Birgin, E.G.2    Martinez, J.M.3    Chambouleyron, I.4
  • 2
    • 0020940620 scopus 로고
    • Determination of the thickness and optical constants of amorphous silicon
    • R. Swanepoel, "Determination of the thickness and optical constants of amorphous silicon," J. Phys. E 16, 1214-1222 (1983).
    • (1983) J. Phys. E , vol.16 , pp. 1214-1222
    • Swanepoel, R.1
  • 3
    • 0001384606 scopus 로고    scopus 로고
    • Estimation of the optical constants and the thickness of thin films using unconstrained optimization
    • E. G. Birgin, I. Chambouleyron, and J. M. Martinez, "Estimation of the optical constants and the thickness of thin films using unconstrained optimization," J. Comput. Phys. 151, 862-880 (1999).
    • (1999) J. Comput. Phys , vol.151 , pp. 862-880
    • Birgin, E.G.1    Chambouleyron, I.2    Martinez, J.M.3
  • 4
    • 0037415945 scopus 로고    scopus 로고
    • Retrieved optical properties of thin films on absorbing substrates from transmittance measurements by application of a spectral projected gradient method
    • W. E. Vargas, D. E. Azofeifa, and N. Clark, "Retrieved optical properties of thin films on absorbing substrates from transmittance measurements by application of a spectral projected gradient method," Thin Solid Films 425, 1-8 (2003).
    • (2003) Thin Solid Films , vol.425 , pp. 1-8
    • Vargas, W.E.1    Azofeifa, D.E.2    Clark, N.3
  • 5
    • 33750136919 scopus 로고    scopus 로고
    • Study of optical constants of films used for the synthesis of broad-band antireflection coatings
    • E. N. Kotlikov and G. V. Tereshchenko "Study of optical constants of films used for the synthesis of broad-band antireflection coatings," Opt. Spectrosc. 82, 603-609 (1997).
    • (1997) Opt. Spectrosc , vol.82 , pp. 603-609
    • Kotlikov, E.N.1    Tereshchenko, G.V.2
  • 6
    • 0013416208 scopus 로고
    • Optical properties of palladium in the visible and near UV spectral regions
    • B. T. Sullivan, "Optical properties of palladium in the visible and near UV spectral regions," Appl. Opt. 29, 1964-1970 (1990).
    • (1990) Appl. Opt , vol.29 , pp. 1964-1970
    • Sullivan, B.T.1
  • 7
    • 1542306764 scopus 로고    scopus 로고
    • Transmission of visible light through oxidized copper films: Feasibility of using a spectral projected gradient method
    • A. Ramirez and W. E. Vargas, "Transmission of visible light through oxidized copper films: feasibility of using a spectral projected gradient method," Appl. Opt. 43, 1508-1514 (2004).
    • (2004) Appl. Opt , vol.43 , pp. 1508-1514
    • Ramirez, A.1    Vargas, W.E.2
  • 8
    • 0012063667 scopus 로고
    • Transmission and reflection of an absorbing thin film on an absorbing substrate
    • R. Swanepoel, "Transmission and reflection of an absorbing thin film on an absorbing substrate," S. Afr. Tydskr. Fis. 12, 148-156 (1989).
    • (1989) S. Afr. Tydskr. Fis , vol.12 , pp. 148-156
    • Swanepoel, R.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.