Influence of growth conditions on microstructure and properties of GaSe crystals

Journal of Crystal Growth

Volumn 300, Issue 2, 2007, Pages 294-298

  Kolesnikov, N N ^a   Borisenko, E B ^a   Borisenko, D N ^a   Gartman, V K ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

A1. Crystal structure; A1. X ray diffraction; B2. Semiconductor II VI materials; B3. Infrared devices

Indexed keywords

CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; INFRARED DEVICES; MICROSTRUCTURE; SEMICONDUCTOR MATERIALS; X RAY DIFFRACTION;

BRIDGMAN TECHNIQUE; CRYSTAL COMPOSITION; NONLINEAR OPTIC MATERIALS; X RAY MICROANALYSIS;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 33847764661     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.01.001     Document Type: Article

References (5)

1. Dmitriev V.G., Gurzadyan G.G., and Nikogosyan D.N. Handbook of Nonlinear Crystals (1991), Springer, Berlin p. 87
2. Singh N.B., Henningsen T., Balakrishna V., Suhre D.R., Fernelius N., et al. J. Crystal Growth 163 (1996) 398
3. Kolesnikov N.N., James R.B., Berzigiarova N.S., and Kulakov M.P. In: James R.B., Franks L.A., Burger A., Westbrook E.M., and Durst R.D. (Eds). Proceedings of SPIE: X-Ray and Gamma-Ray Detectors and Applications IV vol. 4784 (2002) 93-104
4. T.B. Massalski (Ed.), Binary Alloy Phase Diagrams, 2nd ed., vols. 1-2, 1990, ASM Intern Materials Park, Ohio.
5. Ueno K., Takeda N., Sasaki K., and Koma A. Appl. Surf. Sci. 113/114 (1997) 38