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Volumn 505-507, Issue PART 1, 2006, Pages 277-282

Experimental analysis for low-temperature poly-Si films produced by using the excimer laser annealing method

Author keywords

Annealing; Excimer laser; Poly silicon; Re crystallized; Silica

Indexed keywords

ANNEALING; COOLING; EXCIMER LASERS; GRAIN SIZE AND SHAPE; LOW TEMPERATURE EFFECTS; NUCLEATION; SCANNING ELECTRON MICROSCOPY; WAVELENGTH;

EID: 33847760487     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-990-3.277     Document Type: Conference Paper
Times cited : (5)

References (11)
  • 3
    • 0028207696 scopus 로고    scopus 로고
    • D. H. Choi, E. Sadayuki, O. Sugiura, and M. Matsumura, Jpn. J. Appl. Phys, 33 (1A), 70(1994).
    • D. H. Choi, E. Sadayuki, O. Sugiura, and M. Matsumura, Jpn. J. Appl. Phys, 33 (1A), 70(1994).
  • 11
    • 35348926584 scopus 로고    scopus 로고
    • Ph.D. thesis, Department of Physical Electronics Tokyo Institute of Technology, Japan
    • W. C. Yeh, Ph.D. thesis, Department of Physical Electronics (Tokyo Institute of Technology, Japan, 2000).
    • (2000)
    • Yeh, W.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.