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Volumn 505-507, Issue PART 1, 2006, Pages 277-282
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Experimental analysis for low-temperature poly-Si films produced by using the excimer laser annealing method
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Author keywords
Annealing; Excimer laser; Poly silicon; Re crystallized; Silica
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Indexed keywords
ANNEALING;
COOLING;
EXCIMER LASERS;
GRAIN SIZE AND SHAPE;
LOW TEMPERATURE EFFECTS;
NUCLEATION;
SCANNING ELECTRON MICROSCOPY;
WAVELENGTH;
CONTROL PARAMETERS;
EXCIMER LASER ANNEALING METHODS;
HEAT ISOLATED ZONE;
POLY-SI FILMS;
POLYSILICON;
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EID: 33847760487
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/0-87849-990-3.277 Document Type: Conference Paper |
Times cited : (5)
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References (11)
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