Yield-driven electromagnetic optimization via space mapping-based neuromodels

International Journal of RF and Microwave Computer-Aided Engineering

Volumn 12, Issue 1, 2002, Pages 79-89

  Bandler, John W ^a,b   Rayas Sánchez, José E ^b   Zhang, Qi Jun ^c  

^a MCMASTER UNIVERSITY   (Canada)

^b Bandler Corporation   (Canada)

^c CARLETON UNIVERSITY   (Canada)

Author keywords

Design automation; Design centering; EM optimization; Microstrip filters; Microwave circuits; Neural modeling; Neural network applications; Neural space mapping; Optimization methods; Space mapping; Statistical analysis; Yield optimization

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; HIGH TEMPERATURE SUPERCONDUCTORS; MATHEMATICAL MODELS; MICROWAVE CIRCUITS; MICROWAVE FILTERS; NEURAL NETWORKS; OPTIMIZATION; STATISTICAL METHODS;

MICROSTRIP FILTERS;

ELECTROMAGNETIC WAVES;

EID: 0036136280     PISSN: 10964290     EISSN: None     Source Type: Journal    
DOI: 10.1002/mmce.10015     Document Type: Article

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