EM modeling of microstrip conductor losses including surface roughness effect

IEEE Microwave and Wireless Components Letters

Volumn 17, Issue 2, 2007, Pages 94-96

  Chen, Xiaoming ^a,b  

^a IEEE   (Canada)

^b BreconRidge Inc   (Canada)

Author keywords

Electromagnetic (EM) modeling; Losses; Measurement; Multilayers; Rough surfaces; Transmission lines

Indexed keywords

ELECTROMAGNETIC (EM) MODELING; LOSS MEASUREMENT; ROUGH SURFACES;

ELECTRIC CONDUCTORS; ELECTRIC LINES; ELECTRIC LOSS ANGLE MEASUREMENT; METALLIZING; MULTILAYERS; RANDOM ERRORS; SURFACE ROUGHNESS;

MICROSTRIP DEVICES;

EID: 33847745463     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2006.890326     Document Type: Article

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