High-resolution XRD study of stress-modulated YBCO films with various thicknesses

Journal of Crystal Growth

Volumn 300, Issue 2, 2007, Pages 364-367

  Xiong, Jie ^a   Qin, Wenfeng ^a   Cui, Xumei ^a   Tao, Bowan ^a   Tang, Jinlong ^a   Li, Yanrong ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

A1. High resolution reciprocal space mapping; A1. Oxygen vacancies; A1. Residual stress; B2. YBa2Cu3O7 (YBCO) superconducting film

Indexed keywords

CONFORMAL MAPPING; EPITAXIAL GROWTH; OXYGEN VACANCIES; RESIDUAL STRESSES; SUPERCONDUCTING FILMS; X RAY DIFFRACTION;

AXIS ORIENTED GROWTH; HIGH-RESOLUTION RECIPROCAL SPACE MAPPING; YBCO SUPERCONDUCTING FILM;

YTTERBIUM COMPOUNDS;

EID: 33847733114     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.11.335     Document Type: Article

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