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Volumn 101, Issue 2, 2007, Pages

A thickness modulation effect of HfO2 interfacial layer between double-stacked Ag nanocrystals for nonvolatile memory device applications

Author keywords

[No Author keywords available]

Indexed keywords

NANOSTRUCTURED MATERIALS; PYROLYSIS; SINGLE CRYSTALS; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 33847721420     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2430785     Document Type: Article
Times cited : (20)

References (13)
  • 1
    • 33847763853 scopus 로고    scopus 로고
    • L. Stefan, Intel press release, (2001).
    • (2001)
    • Stefan, L.1
  • 13
    • 0004085710 scopus 로고    scopus 로고
    • 2nd ed. (Pearson Prentice-Hall, Upper Saddle River, NJ
    • D. J. Griffiths, Introduction to Quantum Mechanics, 2nd ed. (Pearson Prentice-Hall, Upper Saddle River, NJ, 2005), p. 83.
    • (2005) Introduction to Quantum Mechanics , pp. 83
    • Griffiths, D.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.