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Volumn 3, Issue 9, 2006, Pages 125-132
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Advances in line profile analysis for the study of nanocrystalline systems
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Author keywords
[No Author keywords available]
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Indexed keywords
CERIUM COMPOUNDS;
CRYSTAL DEFECTS;
DIFFRACTION;
POWDER METALS;
SIZE DISTRIBUTION;
AVERBACH METHOD;
CERIUM OXIDE;
NANOCRYSTALLINE OXIDES;
WILLIAMSON HALL PLOT;
NANOCRYSTALLINE POWDERS;
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EID: 33847683292
PISSN: 19385862
EISSN: 19386737
Source Type: Conference Proceeding
DOI: 10.1149/1.2357104 Document Type: Conference Paper |
Times cited : (7)
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References (12)
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