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Volumn 3, Issue 9, 2006, Pages 125-132

Advances in line profile analysis for the study of nanocrystalline systems

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; CRYSTAL DEFECTS; DIFFRACTION; POWDER METALS; SIZE DISTRIBUTION;

EID: 33847683292     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2357104     Document Type: Conference Paper
Times cited : (7)

References (12)
  • 2
    • 0003472812 scopus 로고
    • Addison-Wesley, Reading, MS, USA
    • B.E. Warren, X-ray Diffraction, Addison-Wesley, Reading, MS - USA (1969).
    • (1969) X-ray Diffraction
    • Warren, B.E.1
  • 5
    • 4043108748 scopus 로고    scopus 로고
    • Diffraction Analysis of the Microstructure of Materials
    • and, Editors, Springer-Verlag, Berlin 2004
    • E.J. Mittemeijer and P. Scardi, Editors, Diffraction Analysis of the Microstructure of Materials. Springer Series in Materials Science, Vol. 68, Springer-Verlag, Berlin (2004).
    • Springer Series in Materials Science , vol.68
  • 7
    • 33847627300 scopus 로고    scopus 로고
    • M. Leoni and P. Scardi in Diffraction Analysis of the Microstructure of Materials, E.J. Mittemeijer and P. Scardi, Editors, p. 413. Springer Series in Materials Science, 68, Springer-Verlag, Berlin (2004).
    • M. Leoni and P. Scardi in Diffraction Analysis of the Microstructure of Materials, E.J. Mittemeijer and P. Scardi, Editors, p. 413. Springer Series in Materials Science, Vol. 68, Springer-Verlag, Berlin (2004).
  • 12
    • 0004326059 scopus 로고
    • R. A. Young, Editor, Oxford University Press, Oxford, UK
    • R. A. Young, Editor, The Rietveld Method. Oxford University Press, Oxford - UK (1993).
    • (1993) The Rietveld Method


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.