Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes

Applied Physics Letters

Volumn 90, Issue 9, 2007, Pages

  Chen, Ying ^a   Chen, Hua ^a   Yu, Jun ^a   Williams, James S ^a   Craig, Vince ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; CATALYSTS; CRYSTAL ATOMIC STRUCTURE; ELECTRON MICROSCOPY; PYROLYSIS; SURFACE MORPHOLOGY;

FOCUSED ION BEAM (FIB) MILLING SYSTEMS; NANOSIZED PATTERNS; PATTERNED GROWTH; PREDEPOSITION;

FOCUSED ION BEAMS;

EID: 33847664558     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2710785     Document Type: Article

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