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Volumn 4, Issue 1, 2007, Pages 393-399

Versatile N-type profile engineering by controlling arsenic surface segregation in silicon RPCVD

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; DOPING (ADDITIVES); EPITAXIAL GROWTH; PARTIAL PRESSURE; SILICON; SURFACE SEGREGATION;

EID: 33847656073     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.