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Volumn 4, Issue 1, 2007, Pages 393-399
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Versatile N-type profile engineering by controlling arsenic surface segregation in silicon RPCVD
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ARSENIC;
DOPING (ADDITIVES);
EPITAXIAL GROWTH;
PARTIAL PRESSURE;
SILICON;
SURFACE SEGREGATION;
ARSINE PARTIAL PRESSURE;
CONTROLLABLE DOPING;
CHEMICAL VAPOR DEPOSITION;
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EID: 33847656073
PISSN: 19385862
EISSN: 19386737
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (9)
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