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Volumn 1, Issue , 2000, Pages 64-69

Switching performances of 1200v conventional planar and trench punch-through igbts for clamped inductive load under extensive measurements

Author keywords

Clamped inductive switching; Local lifetime control; Planar punch through IGBT; Trench punch through IGBT

Indexed keywords

CAPACITANCE; ECONOMIC AND SOCIAL EFFECTS; HEAVY IONS; ION BOMBARDMENT; MOTION CONTROL; POWER ELECTRONICS; SWITCHING;

EID: 33847599514     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPEMC.2000.885332     Document Type: Conference Paper
Times cited : (4)

References (7)
  • 1
    • 84889970925 scopus 로고    scopus 로고
    • Power semiconductor devices
    • B.J. Baliga, "Power Semiconductor Devices", PWS, 1996.
    • (1996) Pws
    • Baliga, B.J.1
  • 2
    • 0032307390 scopus 로고    scopus 로고
    • Characteristics of a 1200V PT IGBT with trench gate and local life time control
    • E.R. Motto, J.F. Donlon, H. Takahashi, M. Tabata, H. lwamoto "Characteristics of a 1200V PT IGBT with Trench Gate and Local Life Time Control", Roc. of IEEE IAS 1998, pp.811-816.
    • (1998) Roc. of IEEE IAS , pp. 811-816
    • Motto, E.R.1    Donlon, J.F.2    Takahashi, H.3    Tabata, M.4    Lwamoto, H.5
  • 3
    • 0033307929 scopus 로고    scopus 로고
    • Evaluation of planar and trench IGBT for hard- And soft-switching performance
    • M. Trivedi, K. Shenai, "Evaluation of Planar and Trench IGBT for Hard- And Soft-Switching Performance", Proc. of the IEEE IAS 1999, pp.717-721.
    • (1999) Proc. of the IEEE IAS , pp. 717-721
    • Trivedi, M.1    Shenai, K.2
  • 6
    • 0031638459 scopus 로고    scopus 로고
    • Switching performances comparison of 1200v punch-through and non punch-through IGBTs under hard-switching at high temperature
    • Fukuoka (Japan), 17-10 May
    • S. Azzopardi, C. Jamet, J.M. Vinassa, C. Zardini, "Switching Performances Comparison of 1200V Punch-Through and Non Punch-Through IGBTs under Hard-Switching at High Temperature", Proc. of IEEE PESC, Fukuoka (Japan), 17-10 May 98, pp.1201-1207.
    • Proc. of IEEE PESC , vol.98 , pp. 1201-1207
    • Azzopardi, S.1    Jamet, C.2    Vinassa, J.M.3    Zardini, C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.