Effects of potential and heat treatment on phase transition of alumina dielectric layer

Journal of Electroceramics

Volumn 17, Issue 2-4, 2006, Pages 369-373

  Oh, Han Jun ^a   Lee, Jong Ho ^a   Ahn, Hong Joo ^b   Jeong, Yongsoo ^c   Heo, Chang Hoe ^d   Chi, Choong Soo ^d  

^a Hanseo University   (South Korea)

^b Korea Atomic Energy Research Institute   (South Korea)

^c Korea Institute of Machine and Materials   (South Korea)

^d Kookmin University   (South Korea)

Author keywords

alumina; Aluminum electrolytic capacitors; Anodization; Dielectric layer; Rutherford backscattered spectroscopy

Indexed keywords

AMORPHOUS MATERIALS; ANODIC OXIDATION; CRYSTALLINE MATERIALS; DIELECTRIC DEVICES; ELECTROLYTIC CAPACITORS; HEAT TREATMENT;

Γ-ALUMINA; ALUMINUM ELECTROLYTIC CAPACITORS; ANODIZATION; DIELECTRIC LAYERS;

ALUMINA;

EID: 33847225285     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-006-9009-y     Document Type: Conference Paper

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