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Volumn 17, Issue 2-4, 2006, Pages 287-292

Nanoscale phenomena of gallium-doped ZnO thin films on sapphire substrates

Author keywords

AFM; Photoluminescence; SEM; Thin film; XRD; ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

EID: 33847211476     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-006-9436-9     Document Type: Conference Paper
Times cited : (2)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.