Observer based imaging methods for atomic force microscopy

Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05

Volumn 2005, Issue , 2005, Pages 1185-1190

  Sahoo, Deepak R ^a   De, Tathagata ^a   Salapaka, Murti V ^a  

^a Iowa State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BANDWIDTH; DEMODULATION; Q FACTOR MEASUREMENT; SIGNAL PROCESSING;

ACTIVE QUALITY FACTOR; Q CONTROL METHOD; STEADY STATE SIGNALS; THEORETICAL ANALYSIS;

IMAGING TECHNIQUES;

EID: 33847205755     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CDC.2005.1582319     Document Type: Conference Paper

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