Spectrum analysis of waveform digitizers by IDFT and leakage minimization

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2005, Pages 1717-1722

  Agrež, Dušan ^a  

^a UNIVERSITY OF LJUBLJANA   (Slovenia)

Author keywords

Dynamic ADC testing; Hanning window; Interpolated DFT; Leakage compensation; Spectrum analysis; Uncertainty

Indexed keywords

ANALOG TO DIGITAL CONVERSION; INTERPOLATION; OPTIMIZATION; PROBABILITY DENSITY FUNCTION; SPECTRUM ANALYSIS;

DYNAMIC ADC TESTING; HANNING WINDOW; INTERPOLATED DFT; LEAKAGE COMPENSATION; UNCERTAINTY;

WAVEFORM ANALYSIS;

EID: 33847167412     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

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