Frequency-domain testing of waveform digitizers

IEEE Transactions on Instrumentation and Measurement

Volumn 51, Issue 3, 2002, Pages 445-453

  Petri, Dario ^a,b  

^a IEEE   (Italy)

^b UNIVERSITY OF PERUGIA   (Italy)

Author keywords

Analog digital conversion; Discrete Fourier transform; Frequency domain analysis; Quantization

Indexed keywords

FREQUENCY DOMAIN TESTING; SIGNAL PROCESSING ALGORITHMS; WAVEFORM DIGITIZERS;

ALGORITHMS; FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; PARAMETER ESTIMATION; SIGNAL DISTORTION; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO; SPECTRUM ANALYSIS;

ANALOG TO DIGITAL CONVERSION;

EID: 0036612443     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2002.1017714     Document Type: Article

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