Improved determination of the best fitting sine wave in ADC testing

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2004, Pages 829-834

  Kollár, István ^a   Blair, Jerome J ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b BECHTEL CORPORATION   (United States)

Author keywords

ADC test; Analog to digtial converter; Effective number of bits; ENOB; IEEE Standard 1057 1994; IEEE Standard 1241 2000; Least squares; Sine wave fitting

Indexed keywords

ALGORITHMS; ERROR ANALYSIS; GAUSSIAN NOISE (ELECTRONIC); LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; NATURAL FREQUENCIES; OPTIMIZATION; PARAMETER ESTIMATION;

ADC TESTS; ANALOG-TO-DIGITAL CONVERTER (ADC); EFFECTIVE NUMBER OF BITS; ENOB; IEEE STANDARD 1057-1994; IEEE STANDARD 1241-2000; SINE WAVE FITTING;

ANALOG TO DIGITAL CONVERSION;

EID: 4644283104     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. IEEE Standard 1241-2000, "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters."
2. IEEE Standard 1057-1994, "IEEE Standard Digitizing Waveform Recorders."
3. Blair, J., "Sine-fitting Software for IEEE Standards 1057 and 1241," Proc. IEEE. Instrumentation and Measurement Technology Conference. IMTC/1999, Venice, May 24-26, 1999. pp. 1504-6.
4. van den Bos, A., "Estimation of Fourier Coefficients," IEEE Trans. on Instrumentation and Measurement, Vol. 38. No. 5, Oct. 1989. pp. pp. 1005-1007.
5. Kollár, I., "Evaluation of Sine Wave Tests of ADCs from Windowed Data." Computer Standards and Interfaces, Vol. 22, pp. 261-68, 2000.
6. Hejn, K., and A. Pacut, "Effective Resolution of Analog to Digital Converters - Evolution of Accuracy," IEEE Instrumentation and Measurement Magazine, Vol. 6, No. 3. pp. 48-55. Sep. 2003.
7. Blair, J., and T. Linnenbrink, "Corrected RMS error and effective number of bits for sinewave ADC tests," Computer Standards and Interfaces, Vol. 26, No. 1, pp. 43-49. Jan. 2004.