Optical nonlinearity of oxygen-rich SiOx thin films

Electronics Letters

Volumn 43, Issue 4, 2007, Pages 235-237

  Li, W T ^a   Boswell, R ^a   Samoc, M ^a   Samoc, A ^a   Qin, Q H ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; EVAPORATION; SILICON COMPOUNDS; STOICHIOMETRY; THIN FILMS;

HELICON PLASMA ACTIVATED REACTIVE EVAPORATION; NON-IMPURITY DEFECTS; OPTICAL NONLINEARITY; OXYGEN-RICH FILMS; THERMAL POLING;

NONLINEAR OPTICS;

EID: 33847154602     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20073668     Document Type: Article

References (6)

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