Second-order optical nonlinearity and change in refractive index in silica glasses by a combination of thermal poling and x-ray irradiation

Journal of Applied Physics

Volumn 95, Issue 8, 2004, Pages 4000-4006

  Kameyama, Akihiro ^a   Yokotani, Atsushi ^a   Kurosawa, Kou ^a  

^a UNIVERSITY OF MIYAZAKI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRIC POTENTIAL; ELECTROOPTICAL EFFECTS; IONS; LASER PULSES; OPTICAL COMMUNICATION; POINT DEFECTS; REFRACTIVE INDEX; SAMPLING; SYNCHROTRON RADIATION; X RAY ANALYSIS;

OPTICAL NONLINEARITY; THERMAL POLING; THIN LAYERS; X-RAY RADIATION;

FUSED SILICA;

EID: 2342489498     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1652239     Document Type: Article

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