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Volumn 2005, Issue , 2005, Pages 699-702

An (8158, 7136) low-density parity-check encoder

Author keywords

[No Author keywords available]

Indexed keywords

BINARY CODES; BOOLEAN ALGEBRA; CMOS INTEGRATED CIRCUITS; FLIP FLOP CIRCUITS; POLYNOMIALS; SHIFT REGISTERS;

EID: 33847141037     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2005.1568764     Document Type: Conference Paper
Times cited : (4)

References (16)
  • 2
    • 0033099611 scopus 로고    scopus 로고
    • Good Error Correcting Codes Based on Very Sparse Matrices
    • March
    • D. MacKay, "Good Error Correcting Codes Based on Very Sparse Matrices," IEEE Transactions on Information Theory, March 1999, pp. 399-431.
    • (1999) IEEE Transactions on Information Theory , pp. 399-431
    • MacKay, D.1
  • 4
    • 0035504019 scopus 로고    scopus 로고
    • Low-Density Parity-Check Codes Based on Finite Geometries: A Rediscovery and New Results
    • Nov
    • Y. Kou, S. Lin and M. Fossorier, "Low-Density Parity-Check Codes Based on Finite Geometries: A Rediscovery and New Results", IEEE Transactions on Information Theory, vol. 47, no. 7, Nov. 2001, pp. 2711-2736.
    • (2001) IEEE Transactions on Information Theory , vol.47 , Issue.7 , pp. 2711-2736
    • Kou, Y.1    Lin, S.2    Fossorier, M.3
  • 8
    • 33847168231 scopus 로고    scopus 로고
    • S. Whitaker, L. Miles, J. Gambles, and L. Davis, Mux-Based ROM Using n-Bit Subfunction Encoding, Proceedings of the 8th NASA Symposium on VLSI Design, Albuquerque, NM, Oct. 1999, pp. 3.2.1-3.2.7.
    • S. Whitaker, L. Miles, J. Gambles, and L. Davis, "Mux-Based ROM Using n-Bit Subfunction Encoding", Proceedings of the 8th NASA Symposium on VLSI Design, Albuquerque, NM, Oct. 1999, pp. 3.2.1-3.2.7.
  • 11
    • 0032095217 scopus 로고    scopus 로고
    • Total Dose Hardness of Three Commercial CMOS Microelectronics Foundries
    • June
    • J. Osborn, R. Lacoe, D. Mayer, and G. Yabiku, "Total Dose Hardness of Three Commercial CMOS Microelectronics Foundries", IEEE Transactions On Nuclear Science, Vol. 45, No. 3, June 1998, pp. 1458-1463.
    • (1998) IEEE Transactions On Nuclear Science , vol.45 , Issue.3 , pp. 1458-1463
    • Osborn, J.1    Lacoe, R.2    Mayer, D.3    Yabiku, G.4
  • 12
    • 33847171143 scopus 로고    scopus 로고
    • Q. Shi and G. Maki, New Design Techniques for SEU Immune Circuits, Proceedings of the 9th NASA Symposium on VLSI Design, Albuquerque, NM, Nov. 2000, pp. 7.4.1-7.4.16.
    • Q. Shi and G. Maki, "New Design Techniques for SEU Immune Circuits", Proceedings of the 9th NASA Symposium on VLSI Design, Albuquerque, NM, Nov. 2000, pp. 7.4.1-7.4.16.
  • 13
    • 33847143770 scopus 로고    scopus 로고
    • K. Hass, J. Gambles, B. Walker, and M. Zampaglione, Mitigating Single Event Upsets from Combinational Logic, Proceedings of the 7th NASA Symposium on VLSI Design, Oct. 1998, pp. 4.1.1-4.1.10.
    • K. Hass, J. Gambles, B. Walker, and M. Zampaglione, "Mitigating Single Event Upsets from Combinational Logic", Proceedings of the 7th NASA Symposium on VLSI Design, Oct. 1998, pp. 4.1.1-4.1.10.
  • 15
    • 33846285829 scopus 로고    scopus 로고
    • Apparatus for and Method of Eliminating Single Event Upsets in Combinational Logic
    • U.S. Patent No. 6,326,809, Dec. 4
    • J. Gambles, K. Hass, and K. Cameron, "Apparatus for and Method of Eliminating Single Event Upsets in Combinational Logic", U.S. Patent No. 6,326,809, Dec. 4, 2001.
    • (2001)
    • Gambles, J.1    Hass, K.2    Cameron, K.3
  • 16
    • 0242593210 scopus 로고
    • Mechanism for Preventing Radiation Induced Latchup in CMOS Integrated Circuits
    • U.S. Patent 5,406,513, Apr. 11
    • J. Canaris, S. Whitaker, and K. Cameron, "Mechanism for Preventing Radiation Induced Latchup in CMOS Integrated Circuits", U.S. Patent 5,406,513, Apr. 11, 1995.
    • (1995)
    • Canaris, J.1    Whitaker, S.2    Cameron, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.