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Volumn 2005, Issue , 2005, Pages 1043-1046
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Duty cycle measurement and correction using a random sampling technique
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Author keywords
[No Author keywords available]
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Indexed keywords
DELAY RESOLUTION;
DUTY CYCLE MEASUREMENT;
PIPELINED CIRCUITS;
RANDOM SAMPLING TECHNIQUE;
ANALOG TO DIGITAL CONVERSION;
COMPUTER SIMULATION;
ELECTRIC VARIABLES MEASUREMENT;
ERROR ANALYSIS;
MICROPROCESSOR CHIPS;
RANDOM PROCESSES;
VLSI CIRCUITS;
ELECTRIC CLOCKS;
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EID: 33847136857
PISSN: 15483746
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/MWSCAS.2005.1594283 Document Type: Conference Paper |
Times cited : (24)
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References (15)
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